Theoretical study of infrared emissivity of indium tin oxide films

Wei Jia Zhang, Tian Min Wang, Li Zhi Zhong, Xiao Wen Wu, Min Cui

Research output: Contribution to journalArticlepeer-review

9 Scopus citations


Infrared emissivity of high quality indium tin oxide (ITO) film has been calculated based on the infrared radiation theory and thin film optical theory, the theoretical curves and the testing curves basically agree with each other. It is concluded that when the sheet resistance is less than 30Ω, the theoretical value of infrared emissivity of ITO films on the infrared wave band of 8 μm to 14 μm will be less than 0.1. Therefore, the ITO film of practical sheet resistance less than 10Ω has good infrared stealthy capability. Physical mechanism of low infrared emissivity for ITO film is discussed, and the critical sheet resistance of low infrared emissivity, which conduce to the theoretical study and the manufacture of infrared stealthy ITO film, is put forward in this paper.

Original languageEnglish
Pages (from-to)4439-4444
Number of pages6
JournalWuli Xuebao/Acta Physica Sinica
Issue number9
StatePublished - Sep 2005
Externally publishedYes


  • ITO film
  • Infrared emissivity
  • Sheet resistance
  • Theoretical calculation


Dive into the research topics of 'Theoretical study of infrared emissivity of indium tin oxide films'. Together they form a unique fingerprint.

Cite this