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Temporal surveillance using scan statistics
Joseph Naus, Sylvan Wallenstein
Icahn School of Medicine at Mount Sinai
Research output
:
Contribution to journal
›
Article
›
peer-review
36
Scopus citations
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Keyphrases
Scan Statistics
100%
Temporal Surveillance
100%
Generalized Likelihood Ratio Test
100%
Fixed Window
66%
Number of Events
16%
Retrospective Survey
16%
Window Size
16%
Variable Window Size
16%
Retrospective Analysis
16%
High Correlation
16%
Disease Model
16%
Disease Incidence
16%
Operating Characteristics
16%
Cumulative Sum
16%
Expected number
16%
Surveillance Data
16%
Continuous Observation
16%
New Approximation
16%
Maximum Distribution
16%
Fixed-length
16%
Simple Formula
16%
Grouped Data
16%
Background Rates
16%
Scanning Window
16%
Mathematics
Likelihood Ratio Test
100%
Scan Statistics
100%
Generalized Likelihood Ratio
100%
Statistics
33%
Retrospective Analysis
16%
Grouped Data
16%
Arbitrary Model
16%
Engineering
Generalized Likelihood Ratio Test
100%
Operating Characteristic
16%
Alternative Model
16%
Constant Background
16%