System for monitoring the thickness of transparent layered structures

S. D. Klyce, S. R. Russell

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Abstract

A system is described that will track light reflections from transparent lamellar structures and will provide a running time average of the thicknesses of the component layers. Thicknesses measured with the microprocessor-controlled system can be read to 0.2 μm (0.02% of the scan range). Its performance is demonstrated by the effect of a hypotonic shock on the thicknesses of the stroma and epithelium of a rabbit cornea.

Original languageEnglish
Pages (from-to)1318-1321
Number of pages4
JournalReview of Scientific Instruments
Volume49
Issue number9
DOIs
StatePublished - 1978
Externally publishedYes

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