Abstract
A system is described that will track light reflections from transparent lamellar structures and will provide a running time average of the thicknesses of the component layers. Thicknesses measured with the microprocessor-controlled system can be read to 0.2 μm (0.02% of the scan range). Its performance is demonstrated by the effect of a hypotonic shock on the thicknesses of the stroma and epithelium of a rabbit cornea.
Original language | English |
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Pages (from-to) | 1318-1321 |
Number of pages | 4 |
Journal | Review of Scientific Instruments |
Volume | 49 |
Issue number | 9 |
DOIs | |
State | Published - 1978 |
Externally published | Yes |