Abstract
This paper deals with the elliptic-polarized (EP) measuring principle and testing method of the optical parameters of multi-layered thin films. The parameters of EP are computed by means of admittance matrix. The optical parameters of Multi-layered thin films are computed inversely by the digital approximation Monte Carlo method which combines with the simplex method. Above all, this paper is the first to propose the iterative EP measuring method which greatly improves the measuring repeatability and precision of the results. The optimum seeking angle of incidence is the core of the method. The optical parameter of optical recording media film in the crystalline state has been measured with the method. This is very important for optical design of multi-layered thin films on phase-change optical disks.
| Original language | English |
|---|---|
| Pages (from-to) | 1-11 |
| Number of pages | 11 |
| Journal | Beijing Hangkong Hangtian Daxue Xuebao/Journal of Beijing University of Aeronautics and Astronautics |
| Issue number | 4 |
| State | Published - Oct 1993 |
| Externally published | Yes |