Squeezing out hidden force information from scanning force microscopes

Brian A. Todd, Steven J. Eppell, Fredy R. Zypman

Research output: Contribution to journalArticlepeer-review

19 Scopus citations

Abstract

A method to measure force-separation curves with a scanning force microscope is presented. Forces within the "snap to contact" are obtained by high-speed (MHz) measurement of cantilever deflection signals analyzed using the generalized beam theory. Numerical simulation is used to demonstrate the effectiveness of the method. Experimental results show that the method yields complete continuous force-separation curves with flimsy cantilevers in fluids allowing for sensitive force measurements in nonvacuum environments.

Original languageEnglish
Pages (from-to)1888-1890
Number of pages3
JournalApplied Physics Letters
Volume79
Issue number12
DOIs
StatePublished - 17 Sep 2001
Externally publishedYes

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