Soft fault test and diagnosis for analog circuits

Peng Wang, Shiyuan Yang

Research output: Contribution to journalConference articlepeer-review

9 Scopus citations

Abstract

A new SBT diagnosis approach for dealing with soft faults for analog circuits is presented in this paper. A serial of new fault models for analog components are provided and numerical method which can be easily implemented replaces circuit analysis to obtain the fault models before test. Tolerance issue and multifault diagnosis are also discussed in this paper.

Original languageEnglish
Article number1465055
Pages (from-to)2188-2191
Number of pages4
JournalProceedings - IEEE International Symposium on Circuits and Systems
DOIs
StatePublished - 2005
Externally publishedYes
EventIEEE International Symposium on Circuits and Systems 2005, ISCAS 2005 - Kobe, Japan
Duration: 23 May 200526 May 2005

Fingerprint

Dive into the research topics of 'Soft fault test and diagnosis for analog circuits'. Together they form a unique fingerprint.

Cite this