Soft fault test and diagnosis for analog circuits

Peng Wang; Shiyuan Yang

doi:10.1109/ISCAS.2005.1465055

Soft fault test and diagnosis for analog circuits

Peng Wang, Shiyuan Yang

Research output: Contribution to journal › Conference article › peer-review

3 Scopus citations

Abstract

A new SBT diagnosis approach for dealing with soft faults for analog circuits is presented in this paper. A serial of new fault models for analog components are provided and numerical method which can be easily implemented replaces circuit analysis to obtain the fault models before test. Tolerance issue and multifault diagnosis are also discussed in this paper.

Original language	English
Article number	1465055
Pages (from-to)	2188-2191
Number of pages	4
Journal	Proceedings - IEEE International Symposium on Circuits and Systems
DOIs	https://doi.org/10.1109/ISCAS.2005.1465055
State	Published - 2005
Externally published	Yes
Event	IEEE International Symposium on Circuits and Systems 2005, ISCAS 2005 - Kobe, Japan Duration: 23 May 2005 → 26 May 2005

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10.1109/ISCAS.2005.1465055

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title = "Soft fault test and diagnosis for analog circuits",

abstract = "A new SBT diagnosis approach for dealing with soft faults for analog circuits is presented in this paper. A serial of new fault models for analog components are provided and numerical method which can be easily implemented replaces circuit analysis to obtain the fault models before test. Tolerance issue and multifault diagnosis are also discussed in this paper.",

author = "Peng Wang and Shiyuan Yang",

year = "2005",

doi = "10.1109/ISCAS.2005.1465055",

language = "English",

pages = "2188--2191",

journal = "Proceedings - IEEE International Symposium on Circuits and Systems",

issn = "0271-4310",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

note = "IEEE International Symposium on Circuits and Systems 2005, ISCAS 2005 ; Conference date: 23-05-2005 Through 26-05-2005",

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TY - JOUR

T1 - Soft fault test and diagnosis for analog circuits

AU - Wang, Peng

AU - Yang, Shiyuan

PY - 2005

Y1 - 2005

N2 - A new SBT diagnosis approach for dealing with soft faults for analog circuits is presented in this paper. A serial of new fault models for analog components are provided and numerical method which can be easily implemented replaces circuit analysis to obtain the fault models before test. Tolerance issue and multifault diagnosis are also discussed in this paper.

AB - A new SBT diagnosis approach for dealing with soft faults for analog circuits is presented in this paper. A serial of new fault models for analog components are provided and numerical method which can be easily implemented replaces circuit analysis to obtain the fault models before test. Tolerance issue and multifault diagnosis are also discussed in this paper.

UR - http://www.scopus.com/inward/record.url?scp=34548505299&partnerID=8YFLogxK

U2 - 10.1109/ISCAS.2005.1465055

DO - 10.1109/ISCAS.2005.1465055

M3 - Conference article

AN - SCOPUS:34548505299

SN - 0271-4310

SP - 2188

EP - 2191

JO - Proceedings - IEEE International Symposium on Circuits and Systems

JF - Proceedings - IEEE International Symposium on Circuits and Systems

M1 - 1465055

T2 - IEEE International Symposium on Circuits and Systems 2005, ISCAS 2005

Y2 - 23 May 2005 through 26 May 2005

ER -

Soft fault test and diagnosis for analog circuits

Abstract

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