TY - JOUR
T1 - PEDOT/Nafion composite thin films supported on Pt electrodes
T2 - Facile fabrication and electrochemical activities
AU - Wang, Peng
AU - Olbricht, William L.
PY - 2010/5/15
Y1 - 2010/5/15
N2 - Poly-3,4-ethylenedioxythiophene(PEDOT)/Nafion composite thin films were prepared by a facile electrochemical polymerization approach. These films were characterized by wavelength dispersive spectroscopy (WDS), scanning electron microscopy (SEM), atomic/electric force microscopy (AFM/EFM), cyclic voltammetry (CV), potential step chronoamperometry (PSC), and electrochemical impedance spectroscopy (EIS). The as-prepared film was dense and smooth and had nearly uniform PEDOT and Nafion distribution on the nanometer scale with slight localized phase segregation. Electrochemical experiments revealed a PEDOT/Nafion stable potential window and a PEDOT/Nafion overoxidation potential window. Hole mobility in the film was quantified by PSC technique and charge transport theory, and was verified independently by EIS technique.
AB - Poly-3,4-ethylenedioxythiophene(PEDOT)/Nafion composite thin films were prepared by a facile electrochemical polymerization approach. These films were characterized by wavelength dispersive spectroscopy (WDS), scanning electron microscopy (SEM), atomic/electric force microscopy (AFM/EFM), cyclic voltammetry (CV), potential step chronoamperometry (PSC), and electrochemical impedance spectroscopy (EIS). The as-prepared film was dense and smooth and had nearly uniform PEDOT and Nafion distribution on the nanometer scale with slight localized phase segregation. Electrochemical experiments revealed a PEDOT/Nafion stable potential window and a PEDOT/Nafion overoxidation potential window. Hole mobility in the film was quantified by PSC technique and charge transport theory, and was verified independently by EIS technique.
KW - EFM
KW - Electrochemical polymerization
KW - Hole mobility
KW - Nafion
KW - Overoxidation
KW - PEDOT
UR - http://www.scopus.com/inward/record.url?scp=77951138689&partnerID=8YFLogxK
U2 - 10.1016/j.cej.2010.03.052
DO - 10.1016/j.cej.2010.03.052
M3 - Article
AN - SCOPUS:77951138689
SN - 1385-8947
VL - 160
SP - 383
EP - 390
JO - Chemical Engineering Journal
JF - Chemical Engineering Journal
IS - 1
ER -