Abstract
The optical, structural, and mechanical properties of Bi 4V 2 - xM xO 11 - δ (0 ≤ x ≤ 0.4 in the steps of 0.1, M = Mn, Ga, As) oxides have been investigated. The parameters like band gap (E g), Urbach energy (E u), grain size, hardness (H), and fracture strength (K) have been calculated as a function of dopant concentration, i.e., 0 ≤ x ≤ 0.4. In addition to this, the infrared spectra have been obtained for all the dopant oxides with different dopant concentrations. The results are discussed in light of correlation of these optical and mechanical parameters to their electrical properties. The fractured surface is analyzed by X-ray dot mapping to check the segregation of elements and their effect on mechanical properties.
| Original language | English |
|---|---|
| Pages (from-to) | 1231-1238 |
| Number of pages | 8 |
| Journal | Physica Status Solidi (A) Applications and Materials Science |
| Volume | 209 |
| Issue number | 7 |
| DOIs | |
| State | Published - Jul 2012 |
| Externally published | Yes |
Keywords
- infrared spectroscopy
- mechanical properties
- microstructure
- optical properties
- oxides
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