TY - JOUR
T1 - Novel Single- and Double-Gate Race-Track-Shaped Field Emitter Structures
AU - Wang, Baoping
AU - Sin, Johnny K.O.
AU - Cai, Jun
AU - Poon, M. C.
AU - Tang, Yongming
AU - Wang, Chen
AU - Tong, Linsu
N1 - Publisher Copyright:
O 1996 IEEE
PY - 1996
Y1 - 1996
N2 - In this paper, new single- and double-gate racetrack-shaped field emitter structures are reported for the first time. The race-track-shaped edge emission is used to provide good uniformity and large field emission current density, and the double-gate control is used to provide small turn-on voltage. Experimental results show that the turn-on voltage of the single-gate structure is approximately 100 V, and the field emission current density is approximately 2.4 A/cm2 which is over 12 times larger than that of the volcano-shaped emitter structure reported previously. Furthermore, numerical simulations show that turn-on voltage of the double-gate structure is reduced by 30% compared to the single-gate structure.
AB - In this paper, new single- and double-gate racetrack-shaped field emitter structures are reported for the first time. The race-track-shaped edge emission is used to provide good uniformity and large field emission current density, and the double-gate control is used to provide small turn-on voltage. Experimental results show that the turn-on voltage of the single-gate structure is approximately 100 V, and the field emission current density is approximately 2.4 A/cm2 which is over 12 times larger than that of the volcano-shaped emitter structure reported previously. Furthermore, numerical simulations show that turn-on voltage of the double-gate structure is reduced by 30% compared to the single-gate structure.
UR - https://www.scopus.com/pages/publications/0030409316
U2 - 10.1109/IEDM.1996.553592
DO - 10.1109/IEDM.1996.553592
M3 - Conference article
AN - SCOPUS:0030409316
SN - 0163-1918
SP - 313
EP - 316
JO - Technical Digest - International Electron Devices Meeting
JF - Technical Digest - International Electron Devices Meeting
T2 - Proceedings of the 1996 IEEE International Electron Devices Meeting
Y2 - 8 December 1996 through 11 December 1996
ER -