New algorithm for test node selection for analog circuits diagnosis

Eigenfunction is used to describe ambiguity sets for analog circuit diagnosis. Fault isolation and conditional fault isolation are proposed to identify isolation ability of test node. Based on it, mathematic model for test node selection is presented and new selection algorithm is developed. Finally, an. example is given to show the effectiveness of the presented method. And new method for test node selection is presented. Finally three new test node selection algorithms are presented.