TY - GEN
T1 - Multiphase segmentation of deformation using logarithmic priors
AU - Yanovsky, Igor
AU - Thompson, Paul M.
AU - Osher, Stanley
AU - Vese, Luminita
AU - Leow, Alex D.
PY - 2007
Y1 - 2007
N2 - In [8], the authors proposed the large deformation log-unbiased diffeomorphic nonlinear image registration model which has been successfully used to obtain theoretically and intuitively correct deformation maps. In this paper, we extend this idea to simultaneously registering and tracking deforming objects in a sequence of two or more images. We generalize a level set based Chan-Vese multiphase segmentation model to consider Jacobian fields while segmenting regions of growth and shrinkage in deformations. Deforming objects are thus classified based on magnitude of homogeneous deformation. Numerical experiments demonstrating our results include a pair of two-dimensional synthetic images and pairs of two-dimensional and three-dimensional serial MRI images.
AB - In [8], the authors proposed the large deformation log-unbiased diffeomorphic nonlinear image registration model which has been successfully used to obtain theoretically and intuitively correct deformation maps. In this paper, we extend this idea to simultaneously registering and tracking deforming objects in a sequence of two or more images. We generalize a level set based Chan-Vese multiphase segmentation model to consider Jacobian fields while segmenting regions of growth and shrinkage in deformations. Deforming objects are thus classified based on magnitude of homogeneous deformation. Numerical experiments demonstrating our results include a pair of two-dimensional synthetic images and pairs of two-dimensional and three-dimensional serial MRI images.
UR - http://www.scopus.com/inward/record.url?scp=34948834149&partnerID=8YFLogxK
U2 - 10.1109/CVPR.2007.383431
DO - 10.1109/CVPR.2007.383431
M3 - Conference contribution
AN - SCOPUS:34948834149
SN - 1424411807
SN - 9781424411801
T3 - Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
BT - 2007 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, CVPR'07
T2 - 2007 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, CVPR'07
Y2 - 17 June 2007 through 22 June 2007
ER -