Measurement of ambipolar diffusion coefficient using time-delayed four-wave mixing with incoherent light

Xiqing Zhang, Jialong Zhao, Weiping Qin, Shihua Huang

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Ambipolar diffusion coefficient of CdS:Cu has been obtained by time-delayed four-wave mixing with incoherent light. The result, Da = 0.3 cm2s-1, coincides with other reports.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherPubl by Int Soc for Optical Engineering
Pages355-358
Number of pages4
ISBN (Print)0819408999, 9780819408990
DOIs
StatePublished - 1992
Externally publishedYes
Event1992 Shanghai International Symposium on Quantum Optics - Shanghai, China
Duration: 29 Mar 19922 Apr 1992

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume1726
ISSN (Print)0277-786X

Conference

Conference1992 Shanghai International Symposium on Quantum Optics
CityShanghai, China
Period29/03/922/04/92

Fingerprint

Dive into the research topics of 'Measurement of ambipolar diffusion coefficient using time-delayed four-wave mixing with incoherent light'. Together they form a unique fingerprint.

Cite this