Kind of simplified algorithm for multi-fault test generation

Li Hua Wu, Tao Li, Hai Ying Zou, Peng Wang

Research output: Contribution to journalArticlepeer-review


Since there are a lot of exclusive OR operations in Boolean difference algorithm, especially in solving high-order difference equation, a kind of test generation simplified method with constraint conditions is proposed. By analyzing the Boolean difference algorithm,the result obtained was that Boolean functionchanges with variables, so Boolean difference equations can be expressed into identity. To make faults propagate to output, the constraint conditions should be put, so test patterns can be obtained only by solving the identity and constraint conditions without exclusive OR operations in this algorithm. By examples, it has been proved that simplified algorithm is correct and simple, and it is verified that test patterns can detect given faults by VB (Visual Basic) simulation.

Original languageEnglish
Pages (from-to)348-352
Number of pages5
JournalDianji yu Kongzhi Xuebao/Electric Machines and Control
Issue number3
StatePublished - May 2008
Externally publishedYes


  • Boolean difference
  • Combinational logic circuit
  • Constraint condition
  • Test generation algorithm


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