Abstract
The integration of high-temperature superconductors into advanced semiconductor technology is rather intriguing in the microelectronics field. In this paper, we report on YBa2Cu3O7-δ (YBCO) thin films deposited on silicon-on-insulator (SOI) substrates buffered by yttria-stabilized zirconia (YSZ) layers using the in situ pulsed laser deposition (PLD) technique. The strain in the YBCO films and the ageing effect caused by the thermally induced cracks are carefully studied. It is believed that because of the adoption of the SOI substrate, the strain in the YBCO films is greatly relaxed and the quality and stability of YBCO films are rather good, which is advantageous to the superconductive devices.
| Original language | English |
|---|---|
| Pages (from-to) | 51-56 |
| Number of pages | 6 |
| Journal | Superconductor Science and Technology |
| Volume | 19 |
| Issue number | 1 |
| DOIs | |
| State | Published - 1 Jan 2006 |
| Externally published | Yes |