Investigation of the strain relaxation and ageing effect of YBa 2Cu3O7-δ thin films grown on silicon-on-insulator substrates with yttria-stabilized zirconia buffer layers

  • P. Wang
  • , J. Li
  • , W. Peng
  • , Y. F. Chen
  • , D. N. Zheng

Research output: Contribution to journalArticlepeer-review

12 Scopus citations

Abstract

The integration of high-temperature superconductors into advanced semiconductor technology is rather intriguing in the microelectronics field. In this paper, we report on YBa2Cu3O7-δ (YBCO) thin films deposited on silicon-on-insulator (SOI) substrates buffered by yttria-stabilized zirconia (YSZ) layers using the in situ pulsed laser deposition (PLD) technique. The strain in the YBCO films and the ageing effect caused by the thermally induced cracks are carefully studied. It is believed that because of the adoption of the SOI substrate, the strain in the YBCO films is greatly relaxed and the quality and stability of YBCO films are rather good, which is advantageous to the superconductive devices.

Original languageEnglish
Pages (from-to)51-56
Number of pages6
JournalSuperconductor Science and Technology
Volume19
Issue number1
DOIs
StatePublished - 1 Jan 2006
Externally publishedYes

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