Generation of controllable nano-gaps on single wall carbon nanotubes

Jeong Jaesun; Hyun Chung Gu; William J. Buttner; Gary W. Hunter; Joseph R. Stetter; Wang Rong

Generation of controllable nano-gaps on single wall carbon nanotubes

Jeong Jaesun, Hyun Chung Gu, William J. Buttner, Gary W. Hunter, Joseph R. Stetter, Wang Rong

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

We demonstrated the application of the atomic force microscope (AFM) in generation of controllable nano-gaps on single wall carbon nano-tubes (SWCNTs). Tapping mode AFM combined with interleave mode was used to image and manipulate the CNTs. By precise control of the loading force and the scan rate, we were able to generate desired gaps on CNT nanowires ranging from 10.6 nm to 58.8 nm. The gap size dependence on loading force and scan rate was discussed. Such a structure can be applied in fabrication of capacitance-based nano-device toward sensor applications.

Original language	English
Title of host publication	Proceedings of 2006 ASME International Mechanical Engineering Congress and Exposition, IMECE2006 - Electronic and Photonics Packaging
Publisher	American Society of Mechanical Engineers (ASME)
ISBN (Print)	0791837904, 9780791837900
State	Published - 2006
Externally published	Yes
Event	2006 ASME International Mechanical Engineering Congress and Exposition, IMECE2006 - Chicago, IL, United States Duration: 5 Nov 2006 → 10 Nov 2006

Publication series

Name	American Society of Mechanical Engineers, Electronic and Photonic Packaging, EPP
ISSN (Print)	1071-6947

Conference

Conference	2006 ASME International Mechanical Engineering Congress and Exposition, IMECE2006
Country/Territory	United States
City	Chicago, IL
Period	5/11/06 → 10/11/06

Cite this

Jaesun, J., Gu, H. C., Buttner, W. J., Hunter, G. W., Stetter, J. R., & Rong, W. (2006). Generation of controllable nano-gaps on single wall carbon nanotubes. In Proceedings of 2006 ASME International Mechanical Engineering Congress and Exposition, IMECE2006 - Electronic and Photonics Packaging (American Society of Mechanical Engineers, Electronic and Photonic Packaging, EPP). American Society of Mechanical Engineers (ASME).

Jaesun, Jeong ; Gu, Hyun Chung ; Buttner, William J. et al. / Generation of controllable nano-gaps on single wall carbon nanotubes. Proceedings of 2006 ASME International Mechanical Engineering Congress and Exposition, IMECE2006 - Electronic and Photonics Packaging. American Society of Mechanical Engineers (ASME), 2006. (American Society of Mechanical Engineers, Electronic and Photonic Packaging, EPP).

@inproceedings{ec682f352bf04708b8f7721623e59366,

title = "Generation of controllable nano-gaps on single wall carbon nanotubes",

abstract = "We demonstrated the application of the atomic force microscope (AFM) in generation of controllable nano-gaps on single wall carbon nano-tubes (SWCNTs). Tapping mode AFM combined with interleave mode was used to image and manipulate the CNTs. By precise control of the loading force and the scan rate, we were able to generate desired gaps on CNT nanowires ranging from 10.6 nm to 58.8 nm. The gap size dependence on loading force and scan rate was discussed. Such a structure can be applied in fabrication of capacitance-based nano-device toward sensor applications.",

author = "Jeong Jaesun and Gu, {Hyun Chung} and Buttner, {William J.} and Hunter, {Gary W.} and Stetter, {Joseph R.} and Wang Rong",

year = "2006",

language = "English",

isbn = "0791837904",

series = "American Society of Mechanical Engineers, Electronic and Photonic Packaging, EPP",

publisher = "American Society of Mechanical Engineers (ASME)",

booktitle = "Proceedings of 2006 ASME International Mechanical Engineering Congress and Exposition, IMECE2006 - Electronic and Photonics Packaging",

note = "2006 ASME International Mechanical Engineering Congress and Exposition, IMECE2006 ; Conference date: 05-11-2006 Through 10-11-2006",

}

Jaesun, J, Gu, HC, Buttner, WJ, Hunter, GW, Stetter, JR & Rong, W 2006, Generation of controllable nano-gaps on single wall carbon nanotubes. in Proceedings of 2006 ASME International Mechanical Engineering Congress and Exposition, IMECE2006 - Electronic and Photonics Packaging. American Society of Mechanical Engineers, Electronic and Photonic Packaging, EPP, American Society of Mechanical Engineers (ASME), 2006 ASME International Mechanical Engineering Congress and Exposition, IMECE2006, Chicago, IL, United States, 5/11/06.

Generation of controllable nano-gaps on single wall carbon nanotubes. / Jaesun, Jeong; Gu, Hyun Chung; Buttner, William J. et al.
Proceedings of 2006 ASME International Mechanical Engineering Congress and Exposition, IMECE2006 - Electronic and Photonics Packaging. American Society of Mechanical Engineers (ASME), 2006. (American Society of Mechanical Engineers, Electronic and Photonic Packaging, EPP).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Generation of controllable nano-gaps on single wall carbon nanotubes

AU - Jaesun, Jeong

AU - Gu, Hyun Chung

AU - Buttner, William J.

AU - Hunter, Gary W.

AU - Stetter, Joseph R.

AU - Rong, Wang

PY - 2006

Y1 - 2006

N2 - We demonstrated the application of the atomic force microscope (AFM) in generation of controllable nano-gaps on single wall carbon nano-tubes (SWCNTs). Tapping mode AFM combined with interleave mode was used to image and manipulate the CNTs. By precise control of the loading force and the scan rate, we were able to generate desired gaps on CNT nanowires ranging from 10.6 nm to 58.8 nm. The gap size dependence on loading force and scan rate was discussed. Such a structure can be applied in fabrication of capacitance-based nano-device toward sensor applications.

AB - We demonstrated the application of the atomic force microscope (AFM) in generation of controllable nano-gaps on single wall carbon nano-tubes (SWCNTs). Tapping mode AFM combined with interleave mode was used to image and manipulate the CNTs. By precise control of the loading force and the scan rate, we were able to generate desired gaps on CNT nanowires ranging from 10.6 nm to 58.8 nm. The gap size dependence on loading force and scan rate was discussed. Such a structure can be applied in fabrication of capacitance-based nano-device toward sensor applications.

UR - http://www.scopus.com/inward/record.url?scp=84920630614&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:84920630614

SN - 0791837904

SN - 9780791837900

T3 - American Society of Mechanical Engineers, Electronic and Photonic Packaging, EPP

BT - Proceedings of 2006 ASME International Mechanical Engineering Congress and Exposition, IMECE2006 - Electronic and Photonics Packaging

PB - American Society of Mechanical Engineers (ASME)

T2 - 2006 ASME International Mechanical Engineering Congress and Exposition, IMECE2006

Y2 - 5 November 2006 through 10 November 2006

ER -

Jaesun J, Gu HC, Buttner WJ, Hunter GW, Stetter JR, Rong W. Generation of controllable nano-gaps on single wall carbon nanotubes. In Proceedings of 2006 ASME International Mechanical Engineering Congress and Exposition, IMECE2006 - Electronic and Photonics Packaging. American Society of Mechanical Engineers (ASME). 2006. (American Society of Mechanical Engineers, Electronic and Photonic Packaging, EPP).

Generation of controllable nano-gaps on single wall carbon nanotubes

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