Original language | English |
---|---|
Pages (from-to) | 42-43 |
Number of pages | 2 |
Journal | Microscopy and Microanalysis |
Volume | 15 |
Issue number | SUPPL. 2 |
DOIs | |
State | Published - Jul 2009 |
Externally published | Yes |
Energy filtered scanning confocal electron microscopy in a double aberration-corrected transmission electron microscope
P. Wang, G. Behan, A. I. Kirkland, P. D. Nellist
Research output: Contribution to journal › Article › peer-review
2
Scopus
citations