Energy filtered scanning confocal electron microscopy in a double aberration-corrected transmission electron microscope

P. Wang, G. Behan, A. I. Kirkland, P. D. Nellist

Research output: Contribution to journalArticlepeer-review

2 Scopus citations
Original languageEnglish
Pages (from-to)42-43
Number of pages2
JournalMicroscopy and Microanalysis
Issue numberSUPPL. 2
StatePublished - Jul 2009
Externally publishedYes

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