Development of an automated and programmable characterization system for silicon multi-strip sensors

G. Jain; C. Jain; A. Kumar; A. Sisodia; S. Sharma; M. Saxena; A. Bhardwaj; K. Ranjan

doi:10.1016/j.nima.2018.10.115

Development of an automated and programmable characterization system for silicon multi-strip sensors

G. Jain
, C. Jain
, A. Kumar
, A. Sisodia
, S. Sharma
, M. Saxena
, A. Bhardwaj
, K. Ranjan

Research output: Contribution to journal › Review article › peer-review

Abstract

The CMS tracking system will demand a large quantity of multi-strip silicon sensors, which must fulfill stringent tolerance criteria to maintain the physics performance in the High Luminosity (HL) phase of the LHC. Thus, a subset of the fabricated sensors must be extensively tested prior to the installation in the main detector system. This will be achieved through measurement of various global and strip parameters of silicon strip sensors as envisaged in a detailed quality assurance program for phase II upgrade of CMS tracker. Also, to handle the large quantity of the pixel and strip sensors and other constraints, the characterization setup should have multi-functionality features, including automation. A fully automated and programmable characterization system for testing silicon multi-strip sensors has been under development at University of Delhi. The entire system is controlled though an Automated Characterization Suite (ACS). Various features of the characterization system along with some measurement results are presented in this work.

Original language	English
Pages (from-to)	663-665
Number of pages	3
Journal	Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume	936
DOIs	https://doi.org/10.1016/j.nima.2018.10.115
State	Published - 21 Aug 2019
Externally published	Yes

Keywords

CMS
Characterization
Silicon sensor
Tracker

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10.1016/j.nima.2018.10.115

Cite this

Jain, G., Jain, C., Kumar, A., Sisodia, A., Sharma, S., Saxena, M., Bhardwaj, A., & Ranjan, K. (2019). Development of an automated and programmable characterization system for silicon multi-strip sensors. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 936, 663-665. https://doi.org/10.1016/j.nima.2018.10.115

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title = "Development of an automated and programmable characterization system for silicon multi-strip sensors",

abstract = "The CMS tracking system will demand a large quantity of multi-strip silicon sensors, which must fulfill stringent tolerance criteria to maintain the physics performance in the High Luminosity (HL) phase of the LHC. Thus, a subset of the fabricated sensors must be extensively tested prior to the installation in the main detector system. This will be achieved through measurement of various global and strip parameters of silicon strip sensors as envisaged in a detailed quality assurance program for phase II upgrade of CMS tracker. Also, to handle the large quantity of the pixel and strip sensors and other constraints, the characterization setup should have multi-functionality features, including automation. A fully automated and programmable characterization system for testing silicon multi-strip sensors has been under development at University of Delhi. The entire system is controlled though an Automated Characterization Suite (ACS). Various features of the characterization system along with some measurement results are presented in this work.",

keywords = "CMS, Characterization, Silicon sensor, Tracker",

author = "G. Jain and C. Jain and A. Kumar and A. Sisodia and S. Sharma and M. Saxena and A. Bhardwaj and K. Ranjan",

note = "Publisher Copyright: {\textcopyright} 2018 Elsevier B.V.",

year = "2019",

month = aug,

day = "21",

doi = "10.1016/j.nima.2018.10.115",

language = "English",

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Jain, G, Jain, C, Kumar, A, Sisodia, A, Sharma, S, Saxena, M, Bhardwaj, A & Ranjan, K 2019, 'Development of an automated and programmable characterization system for silicon multi-strip sensors', Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, vol. 936, pp. 663-665. https://doi.org/10.1016/j.nima.2018.10.115

Development of an automated and programmable characterization system for silicon multi-strip sensors. / Jain, G.; Jain, C.; Kumar, A. et al.
In: Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 936, 21.08.2019, p. 663-665.

Research output: Contribution to journal › Review article › peer-review

TY - JOUR

T1 - Development of an automated and programmable characterization system for silicon multi-strip sensors

AU - Jain, G.

AU - Jain, C.

AU - Kumar, A.

AU - Sisodia, A.

AU - Sharma, S.

AU - Saxena, M.

AU - Bhardwaj, A.

AU - Ranjan, K.

PY - 2019/8/21

Y1 - 2019/8/21

N2 - The CMS tracking system will demand a large quantity of multi-strip silicon sensors, which must fulfill stringent tolerance criteria to maintain the physics performance in the High Luminosity (HL) phase of the LHC. Thus, a subset of the fabricated sensors must be extensively tested prior to the installation in the main detector system. This will be achieved through measurement of various global and strip parameters of silicon strip sensors as envisaged in a detailed quality assurance program for phase II upgrade of CMS tracker. Also, to handle the large quantity of the pixel and strip sensors and other constraints, the characterization setup should have multi-functionality features, including automation. A fully automated and programmable characterization system for testing silicon multi-strip sensors has been under development at University of Delhi. The entire system is controlled though an Automated Characterization Suite (ACS). Various features of the characterization system along with some measurement results are presented in this work.

AB - The CMS tracking system will demand a large quantity of multi-strip silicon sensors, which must fulfill stringent tolerance criteria to maintain the physics performance in the High Luminosity (HL) phase of the LHC. Thus, a subset of the fabricated sensors must be extensively tested prior to the installation in the main detector system. This will be achieved through measurement of various global and strip parameters of silicon strip sensors as envisaged in a detailed quality assurance program for phase II upgrade of CMS tracker. Also, to handle the large quantity of the pixel and strip sensors and other constraints, the characterization setup should have multi-functionality features, including automation. A fully automated and programmable characterization system for testing silicon multi-strip sensors has been under development at University of Delhi. The entire system is controlled though an Automated Characterization Suite (ACS). Various features of the characterization system along with some measurement results are presented in this work.

KW - CMS

KW - Characterization

KW - Silicon sensor

KW - Tracker

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U2 - 10.1016/j.nima.2018.10.115

DO - 10.1016/j.nima.2018.10.115

M3 - Review article

AN - SCOPUS:85055747083

SN - 0168-9002

VL - 936

SP - 663

EP - 665

JO - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

JF - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

ER -

Development of an automated and programmable characterization system for silicon multi-strip sensors

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Keywords

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