Contrast reversal in atomic-resolution chemical mapping

P. Wang; A. J. D'Alfonso; S. D. Findlay; L. J. Allen; A. L. Bleloch

doi:10.1103/PhysRevLett.101.236102

Contrast reversal in atomic-resolution chemical mapping

P. Wang, A. J. D'Alfonso, S. D. Findlay, L. J. Allen, A. L. Bleloch

Research output: Contribution to journal › Article › peer-review

38 Scopus citations

Abstract

We report an unexpected result obtained using chemical mapping on the new, aberration corrected Nion UltraSTEM at Daresbury. Using different energy windows above the L2,3 edge in |011| silicon to map the position of the atomic columns we find a contrast reversal which produces an apparent and misleading translation of the silicon columns. Using simulations of the imaging process, we explain the intricate physical mechanisms leading to this effect.

Original language	English
Article number	236102
Journal	Physical Review Letters
Volume	101
Issue number	23
DOIs	https://doi.org/10.1103/PhysRevLett.101.236102
State	Published - 2 Dec 2008
Externally published	Yes

Access to Document

10.1103/PhysRevLett.101.236102

Cite this

@article{3c09298f55ba45ab88ce7a56c3bd106f,

title = "Contrast reversal in atomic-resolution chemical mapping",

abstract = "We report an unexpected result obtained using chemical mapping on the new, aberration corrected Nion UltraSTEM at Daresbury. Using different energy windows above the L2,3 edge in |011| silicon to map the position of the atomic columns we find a contrast reversal which produces an apparent and misleading translation of the silicon columns. Using simulations of the imaging process, we explain the intricate physical mechanisms leading to this effect.",

author = "P. Wang and D'Alfonso, \{A. J.\} and Findlay, \{S. D.\} and Allen, \{L. J.\} and Bleloch, \{A. L.\}",

year = "2008",

month = dec,

day = "2",

doi = "10.1103/PhysRevLett.101.236102",

language = "English",

volume = "101",

journal = "Physical Review Letters",

issn = "0031-9007",

publisher = "American Physical Society",

number = "23",

}

TY - JOUR

T1 - Contrast reversal in atomic-resolution chemical mapping

AU - Wang, P.

AU - D'Alfonso, A. J.

AU - Findlay, S. D.

AU - Allen, L. J.

AU - Bleloch, A. L.

PY - 2008/12/2

Y1 - 2008/12/2

N2 - We report an unexpected result obtained using chemical mapping on the new, aberration corrected Nion UltraSTEM at Daresbury. Using different energy windows above the L2,3 edge in |011| silicon to map the position of the atomic columns we find a contrast reversal which produces an apparent and misleading translation of the silicon columns. Using simulations of the imaging process, we explain the intricate physical mechanisms leading to this effect.

AB - We report an unexpected result obtained using chemical mapping on the new, aberration corrected Nion UltraSTEM at Daresbury. Using different energy windows above the L2,3 edge in |011| silicon to map the position of the atomic columns we find a contrast reversal which produces an apparent and misleading translation of the silicon columns. Using simulations of the imaging process, we explain the intricate physical mechanisms leading to this effect.

UR - https://www.scopus.com/pages/publications/57149111682

U2 - 10.1103/PhysRevLett.101.236102

DO - 10.1103/PhysRevLett.101.236102

M3 - Article

AN - SCOPUS:57149111682

SN - 0031-9007

VL - 101

JO - Physical Review Letters

JF - Physical Review Letters

IS - 23

M1 - 236102

ER -

Contrast reversal in atomic-resolution chemical mapping

Abstract

Access to Document

Fingerprint

Cite this