Contrast reversal in atomic-resolution chemical mapping

P. Wang, A. J. D'Alfonso, S. D. Findlay, L. J. Allen, A. L. Bleloch

Research output: Contribution to journalArticlepeer-review

38 Scopus citations


We report an unexpected result obtained using chemical mapping on the new, aberration corrected Nion UltraSTEM at Daresbury. Using different energy windows above the L2,3 edge in |011| silicon to map the position of the atomic columns we find a contrast reversal which produces an apparent and misleading translation of the silicon columns. Using simulations of the imaging process, we explain the intricate physical mechanisms leading to this effect.

Original languageEnglish
Article number236102
JournalPhysical Review Letters
Issue number23
StatePublished - 2 Dec 2008
Externally publishedYes


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