A slit-lamp eyepiece micrometer calibrated at 50-micron intervals

  • R. Ritch
  • , R. Galvao-Filho
  • , J. M. Liebmann

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

Measurements of dimensions of various intraocular structures, both normal and abnormal, are both theoretically and clinically useful. The currently available standard Haag-Streit slit-lamp micrometer eyepiece is calibrated at 100 micron intervals. In order to achieve greater precision in measurement of smaller intraocular structures, the authors and Haag-Streit, Inc. (Kaniz, Switzerland) have developed an eyepiece calibrated in 50-micron intervals.

Original languageEnglish
Pages (from-to)326
Number of pages1
JournalOphthalmic Surgery and Lasers
Volume30
Issue number4
StatePublished - 1999
Externally publishedYes

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