A high-resolution x-ray fluorescence spectrometer for near-edge absorption studies

V. Stojanoff, K. Hämäläinen, D. P. Siddons, J. B. Hastings, L. E. Berman, S. Cramer, G. Smith

Research output: Contribution to journalArticlepeer-review

60 Scopus citations

Abstract

A high-resolution fluorescence spectrometer using a Johann geometry in a backscattering arrangement was developed. The spectrometer, with a resolution of 0.3 eV at 6.5 keV, combined with an incident beam, with a resolution of 0.7 eV, form the basis of a high-resolution instrument for measuring x-ray absorption spectra. The advantages of the instrument are illustrated with the near-edge absorption spectrum of dysprosium nitrate.

Original languageEnglish
Pages (from-to)1125-1127
Number of pages3
JournalReview of Scientific Instruments
Volume63
Issue number1
DOIs
StatePublished - 1992
Externally publishedYes

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