US Patent Issued to SICHUAN UNIVERSITY on Oct. 3 for "Diffraction analysis device and method for full-field x-ray fluorescence imaging analysis" (Chinese Inventors)

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Period4 Oct 2023

Media coverage

1

Media coverage

  • TitleUS Patent Issued to SICHUAN UNIVERSITY on Oct. 3 for "Diffraction analysis device and method for full-field x-ray fluorescence imaging analysis" (Chinese Inventors)
    Media name/outletUS Fed News
    Country/TerritoryUnited States
    Date4/10/23
    PersonsPeng Wang
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