Investigators at Samsung Electronics Co. Ltd Detail Findings in Electronics (A 4-nm 1.15 Tb/s Hbm3 Interface With Resistor-tuned Offset Calibration and In Situ Margin Detection)

Media coverage

• Title	Investigators at Samsung Electronics Co. Ltd Detail Findings in Electronics (A 4-nm 1.15 Tb/s Hbm3 Interface With Resistor-tuned Offset Calibration and In Situ Margin Detection)
  Media name/outlet	South Korea Daily Report
  Country/Territory	United States
  Date	3/01/24
  Persons	Won Hee Lee